Effect of charge transfer efficiency on image quality in CCD line scan-based web inspection

✍ Scribed by Jyrki Laitinen

• Book ID: 108402064
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 309 KB
• Volume: 29
• Category: Article
• ISSN: 0143-8166
• DOI: 10.1016/s0143-8166(98)00004-9