Effect of cascade localization induced bias effect and fluctuation of point defect reactions on defect structure evolution near planar sinks

✍ Scribed by T. Yoshiie; M. Kiritani

• Book ID: 107810870
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 692 KB
• Volume: 212-215
• Category: Article
• ISSN: 0022-3115
• DOI: 10.1016/0022-3115(94)90078-7