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EFFECT OF CALIBRATION AND SCANNING PROTOCOLS FOR CASE SPECIFIC FINITE ELEMENT ANALYSIS

✍ Scribed by E. Tanck; I. Knippels; JCW. Deenen; JB. Van Aken; JH. Keyak; H. Huizenga; N. Verdonschot


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
109 KB
Volume
41
Category
Article
ISSN
0021-9290

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## Abstract A novel numerical de‐embedding scheme called the short‐open calibration (SOC) technique, in conjunction with the vector finite element method (FEM), has been developed to characterize two‐port network of arbitrarily shaped, three‐dimensional discontinuities in microwave circuits. This S