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Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O2 electrodes

โœ Scribed by Li-Shin Chang; Yi-Chun Lin; Ching-Yi Su; Hung-Chun Wu; Jing-Pin Pan


Book ID
116244640
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
226 KB
Volume
258
Category
Article
ISSN
0169-4332

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