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Effect of built-in bias fields on the nanoscale switching in ferroelectric thin films

✍ Scribed by D. Fu; K. Suzuki; K. Kato; H. Suzuki

Book ID: 106019055
Publisher: Springer
Year: 2005
Tongue: English
Weight: 331 KB
Volume: 80
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-003-2348-5

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