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Effect of Auger recombination on the thermal stability of high-voltage high-power semiconductor diodes

✍ Scribed by T. T. Mnatsakanov; M. E. Levinshteĭn; A. S. Freĭdlin


Book ID
111443971
Publisher
Springer
Year
2008
Tongue
English
Weight
279 KB
Volume
42
Category
Article
ISSN
1063-7826

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