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Effect of a change in the intermediate layer accompanying deposition of metal on the electrophysical properties of a metal-semiconductor contact

✍ Scribed by S. S. Kil'chitskaya; S. V. Litvinenko; V. A. Skryshevskii; V. I. Strikha; V. P. Tolstoi

No coin nor oath required. For personal study only.

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