Effect of 1/f-type FM noise on semiconductor-laser linewidth residual in high-power limit

✍ Scribed by Kikuchi, K.

• Book ID: 117867136
• Publisher: IEEE
• Year: 1989
• Tongue: English
• Weight: 375 KB
• Volume: 25
• Category: Article
• ISSN: 0018-9197
• DOI: 10.1109/3.17331