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EDIM93: a program for electron diffraction intensity measurement from photographic data

✍ Scribed by Cheng, T. Z. ;Wang, J. F. ;Wan, Z. H. ;Sha, B. D.

Book ID: 114500825
Publisher: International Union of Crystallography
Year: 1994
Tongue: English
Weight: 364 KB
Volume: 27
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889893012968

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