Edge passivation and related electrical stability in silicon power devices : S. Salkalachen, N. H. Krishnan, S. Krishnan, H. B. Satyamurthy and K. S. Srinivas. IEEE Trans. Semiconductor Mfg3(1), 12 (1990)

• Book ID: 103286215
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 128 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90592-b