Edge domain dependent pinning effect by stray field in patterned magnetic tunnel junction

✍ Scribed by Shimomura, N.; Kishi, T.; Yoshikawa, M.; Kitagawa, E.; Asao, Y.; Hada, H.; Yoda, H.; Tahara, S.

• Book ID: 114650525
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 125 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2005.854938