✦ LIBER ✦
Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic
✍ Scribed by V.V.N. Obreja; C. Codreanu; D. Poenar; O. Buiu
- Book ID
- 104056470
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 793 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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