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Eddy current sensor concepts for the Bridgman growth of semiconductors

โœ Scribed by Kumar P. Dharmasena; Haydn N.G. Wadley


Book ID
108342231
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
831 KB
Volume
172
Category
Article
ISSN
0022-0248

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Semi-analytical calculation of the imped
โœ Bachir Maouche; Rezak Alkama; Mouloud Feliachi ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 982 KB

In this contribution, we aim at the modelling of the impedance of a differential sensor in eddy-current non-destructive testing. This mode of control is very common in the detection of abrupt geometrical and electromagnetic variations, disturbances generated by slow variations of dimensions and temp