✦ LIBER ✦
[ECS ISTC/CSTIC 2009 (CISTC) - Shanghai, China (March 19 - March 20, 2009)] ECS Transactions - Characteristic Variations Induced by Random Fluctuation of Source/Drain Lateral Distribution Dopant in Nano-Scale UTB SOI MOSFET
✍ Scribed by Du, Linfeng; Deng, Hui; Du, Gang; Han, Ruqi; Zhang, Shengdong
- Book ID
- 118185312
- Publisher
- ECS
- Year
- 2009
- Weight
- 400 KB
- Volume
- 0
- Category
- Article
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