[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Interface Barrier Determination by Internal Photoemission: Applications to Metal/Oxide/Semiconductor Structure

✍ Scribed by Nguyen, Nhan V.; Kirillov, Oleg A.; Jiang, Weirong; Maslar, James E.; Kimes, William; Suehle, John S.

• Book ID: 115503875
• Publisher: ECS
• Year: 2008
• Weight: 299 KB
• Volume: 13
• Category: Article
• DOI: 10.1149/1.2908628