[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Nano-Scale Profile of the Dielectric Constant Near the Si/oxide Interface: A First-Principles Approach

✍ Scribed by Nakamura, Jun; Wakui, Sadakazu; Eguchi, Shunsuke; Yanai, Ryosuke; Natori, Akiko

• Book ID: 118149508
• Publisher: ECS
• Year: 2007
• Weight: 530 KB
• Volume: 11
• Category: Article
• DOI: 10.1149/1.2778375