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[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Study of the Impact of Electron Traps on GaN HEMT Reliability

โœ Scribed by Katzer, D. Scott; Mittereder, Jeffrey; Binari, Steven; Storm, David; Roussos, Jason; Klein, Paul


Book ID
121864041
Publisher
ECS
Year
2006
Weight
418 KB
Volume
3
Category
Article

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