✦ LIBER ✦

[ECS 209th ECS Meeting - Denver, Colorado (May 7-May 12, 2006)] ECS Transactions - Charge Trapping in High-k Gate Dielectrics: A Recent Understanding

✍ Scribed by Luna-Sánchez, Rosa María; González-Martínez, Ignacio

No coin nor oath required. For personal study only.

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