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ECR plasma etch fabrication of C-doped base InGaAs/InP DHBT structures: A comparison of CH4/H2/Ar vs BCl3/N2plasma etch chemistries

✍ Scribed by R. F. Kopf; R. A. Hamm; R. J. Malik; R. W. Ryan; M. Geva; J. Burm; A. Tate


Book ID
107457779
Publisher
Springer US
Year
1998
Tongue
English
Weight
227 KB
Volume
27
Category
Article
ISSN
0361-5235

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