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E-beam process control for the fabrication of T-shaped gates for GaAs MESFETs with dimensions down to 80 nm

✍ Scribed by L. Luciani; M. Gentili; E. Di Fabrizio; B. Gabbrielli


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
284 KB
Volume
17
Category
Article
ISSN
0167-9317

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