Dynamics of metal-SiOx and SiOxSi interfaces and the associated instabilities in practical metal/insulator/semiconductor structures

✍ Scribed by G. Rajeswaran; W.A. Anderson; M. Jackson; M. Thayer

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 385 KB
• Volume: 104
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(83)90576-x