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Dynamics of deep level trapping in space charge regions

✍ Scribed by A.K. Jonscher

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
471 KB
Volume
33
Category
Article
ISSN
0038-1101

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✍ Marta Tello; Marco Chiesa; Claudia M. Duffy; Henning Sirringhaus πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 648 KB

## Abstract A scanning Kelvin probe microscopy (SKPM) study of the surface potential of vacuum sublimed pentacene transistors under bias stress and its correlation with the film morphology is presented. While for thicker films there are some trapping centers inhomogeneously distributed over the fil