✦ LIBER ✦
Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing
✍ Scribed by Zhao, D.; Upadhyaya, S.
- Book ID
- 117907341
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 624 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0278-0070
No coin nor oath required. For personal study only.