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Dynamical images of dislocations in X-ray diffraction topographs

✍ Scribed by Gerward, L.


Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
485 KB
Volume
2
Category
Article
ISSN
0031-8965

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## Abstract We have observed dislocations in a CZ‐silicon crystal using step‐scanning white X‐ray section topography and examined the feature of the dislocation images reconstructed by stacking 200 shots of sec‐ tion topographs. These topographs were obtained from symmetric 004‐reflection in the La