Dynamical diffraction effects on higher-order laue zone lines in CBED patterns of semiconductors

✍ Scribed by T. Okuyama; S. Matsumura; N. Kuwano; K. Oki; Y. Tomokiyo

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 973 KB
• Volume: 31
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(89)90053-3