𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Dynamic-mechanical and dielectric characterization of PEEK crystallization

✍ Scribed by A. D'Amore; J. M. Kenny; L. Nicolais; V. Tucci

Book ID
104522674
Publisher
Society for Plastic Engineers
Year
1990
Tongue
English
Weight
649 KB
Volume
30
Category
Article
ISSN
0032-3888

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✦ Synopsis

Abstract

Dynamic‐mechanical and dielectric characterization of the cold crystallization of PEEK has been performed in order to develop a non‐destructive evaluation method of crystallinity in thermoplastic matrices. The Avrami approach is applied here to describe the Poly(ether ether ketone) (PEEK) crystallization kinetics after an appropriate reduction of dynamic‐mechanical and dielectric parameters. Avrami exponents obtained from dielectric characterization are comparable with those obtained with DSC measurements reported in literature, while the exponents obtained from the dynamic‐mechanical characterization are higher, reflecting also changes in the aspect ratio of the growing crystals. Variations in the glass transition temperature detected during cold crystallization are analyzed and analogies between PEEK and PET are discussed.

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