Dynamic malfunction limits in high-speed TTL and ECL integrated digital gates : M. Abdel-Latif and M. J. O. Strutt. Microelectron. & Reliab.12, 57 (1973)

• Book ID: 103272740
• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 104 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90157-7