✦ LIBER ✦
Dynamic inspection of large scale integrated circuits : M. R. Child, D. W. Ranasinghe and D. White. Microelectronics7 (3), (1976)
- Book ID
- 103272235
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 130 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0026-2714
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