✦ LIBER ✦
Dual-Source-Line-Bias Scheme to Improve the Read Margin and Sensing Accuracy of STTRAM in Sub-90-nm Nodes
✍ Scribed by Chatterjee, S.; Salahuddin, S.; Mukhopadhyay, S.
- Book ID
- 115498685
- Publisher
- Institute of Electrical and Electronics Engineers
- Year
- 2010
- Tongue
- English
- Weight
- 615 KB
- Volume
- 57
- Category
- Article
- ISSN
- 1549-7747
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