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Dual-Material-Gate Technique for Enhanced Transconductance and Breakdown Voltage of Trench Power MOSFETs

✍ Scribed by Saxena, R.S.; Kumar, M.J.


Book ID
114619322
Publisher
IEEE
Year
2009
Tongue
English
Weight
901 KB
Volume
56
Category
Article
ISSN
0018-9383

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