Dual EMAT and PEC non-contact probe: applications to defect testing

✍ Scribed by R.S. Edwards; A. Sophian; S. Dixon; G.-Y. Tian; X. Jian

• Book ID: 104064876
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 341 KB
• Volume: 39
• Category: Article
• ISSN: 0963-8695
• DOI: 10.1016/j.ndteint.2005.06.001