## Abstract The scale, scope and complexity of the manufacturing operations in a semiconductor fab lead to some unique challenges in ensuring product quality and production efficiency. We describe the use of various analytical techniques, based on data mining, process trace data analysis, stochasti
DROWNING IN DATA: Informatics and modeling challenges in a data-rich networked world
β Scribed by Venkat Venkatasubramanian
- Publisher
- American Institute of Chemical Engineers
- Year
- 2009
- Tongue
- English
- Weight
- 183 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0001-1541
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