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Drop/impact tests and analysis of typical portable electronic devices

✍ Scribed by C.Y. Zhou; T.X. Yu; Ricky S.W. Lee

Book ID: 108146216
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 985 KB
Volume: 50
Category: Article
ISSN: 0020-7403
DOI: 10.1016/j.ijmecsci.2007.09.012

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