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Drift of the breakdown voltage in highly doped planar junctions : J. F. Verway, J. H. Aalberts and B. J. de Maagt. Microelectron. & Reliab.12, 51 (1973)


Publisher
Elsevier Science
Year
1974
Tongue
English
Weight
106 KB
Volume
13
Category
Article
ISSN
0026-2714

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