Drift mobility of thermalized and highly energetic holes in thin layers of amorphous dielectric SiC

✍ Scribed by Sielski, Jan ;Jeszka, Jeremiasz K.

• Book ID: 115561486
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 252 KB
• Volume: 209
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201228179