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Drift mobility measurements in thin epitaxial semiconductor layers using time-of-flight techniques

✍ Scribed by A.G.R. Evans; P.N. Robson

Book ID: 107856081
Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 584 KB
Volume: 17
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(74)90028-8

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