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Drift-mobility measurements and mobility edges in disordered silicons

✍ Scribed by Schiff, E A

Book ID: 125885227
Publisher: Institute of Physics
Year: 2004
Tongue: English
Weight: 148 KB
Volume: 16
Category: Article
ISSN: 0953-8984
DOI: 10.1088/0953-8984/16/44/023

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