Double correlation technique (DDLTS) for the analysis of deep level profiles in GaAs and GaAs0.6P0.4

✍ Scribed by Lefevre, H.; Schulz, M.

• Book ID: 114592472
• Publisher: IEEE
• Year: 1977
• Tongue: English
• Weight: 472 KB
• Volume: 24
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1977.18863