We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air-gaps. The technique provides frequency calibration across the measurement b
Doppler calibration method for Spectral Domain OCT spectrometers
β Scribed by Dirk J. Faber; Ton G. van Leeuwen
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 318 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1864-063X
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β¦ Synopsis
Abstract
We present a calibration method for SDβOCT domain spectrometers based on the Mβscan of a moving mirror. This method allows determination of the wavenumber sampling increment which determines the depth axis assigned to the structural image. It also allows wavelength calibration of individual pixels which ensures correct reβsampling prior to Fast Fourier Transform. Determination of the spectrometer resolution, which determines sensitivity and resolution decay with depth, is also possible. The wavelength calibration results suggest that hardware calibration of the spectrometers is a necessary complement to the computational methods presented here. (Β© 2009 WILEYβVCH Verlag GmbH & Co. KGaA, Weinheim)
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