๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Domain structures of CdTe layers grown by MOCVD on offset-angle sapphire substrates

โœ Scribed by Kenji Maruyama; Mitsuo Yoshikawa; Hiroshi Takigawa

Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
599 KB
Volume
93
Category
Article
ISSN
0022-0248

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Improvement of crystal quality of AlN gr
Improvement of crystal quality of AlN grown on sapphire substrate by MOCVD
โœ Mu-Jen Lai; Liann-Be Chang; Tzu-Tao Yuan; Ray-Ming Lin ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 142 KB ๐Ÿ‘ 1 views

## Abstract The crystalline quality of aluminum nitride (AlN) epilayers grown on sapphire substrates by MOCVD was improved by increasing hydrogen flow rate during the high temperature growth process. The AlN epilayer exhibited a root mean square (rms) of roughness was 1.944 nm from the 2ร—2 ยตm^2^ si