✦ LIBER ✦

Domain pattern measurements using CCD

✍ Scribed by Honda, A.; Shirae, K.

Book ID: 114645743
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 457 KB
Volume: 17
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.1981.1061615

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analysis of CCD moiré pattern for micro-

Analysis of CCD moiré pattern for micro-range measurements using the wavelet transform

✍ Rong-Seng Chang; Jin-Yi Sheu; Ching-Huang Lin; He-Chiang Liu 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 110 KB

A new approach based on the moirÃ e theory and wavelet transform (WT) is proposed for measuring the micro-range distance between a charge-couple-device (CCD) camera and a two-dimensional reference grating. The micro-range distance is determined by measuring the pitch of the moirÃ e pattern image, wh

Refractive Index Measurements using a CC

Refractive Index Measurements using a CCD

✍ Mian, S. M. ;Hamad, A. Y. ;Wicksted, J. P. 📂 Article 📅 1996 🏛 The Optical Society 🌐 English ⚖ 366 KB

CMM uses CCD for PCB measurement

📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 237 KB

Picosecond-domain radiation pattern meas

Picosecond-domain radiation pattern measurement using fiber-coupled photoconductive antenna

✍ Heeseok Lee; Jongjoo Lee; Joungho Kim 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 185 KB

Spectral measurements of local parameter

Spectral measurements of local parameters of plasmas using CCD matrices

✍ S. V. Goryachev; É. Kh. Isakaev; M. I. Myasnikov; V. F. Chinnov 📂 Article 📅 2008 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 340 KB

Measurements of surface roughness: use o

Measurements of surface roughness: use of a CCD camera to correlate doubly scattered speckle patterns

✍ Basano, Lorenzo ;Leporatti, Stefano ;Ottonello, Pasquale ;Palestini, Valeria ;Ro 📂 Article 📅 1995 🏛 The Optical Society 🌐 English ⚖ 474 KB