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Distribution of residual strain around nanoindentations in silicon

✍ Scribed by Li, X.; Li, Z.; Tao, X.F.; Ren, L.L.; Gao, S.T.; Xu, G.F.


Book ID
124129774
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
1018 KB
Volume
132
Category
Article
ISSN
0167-577X

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