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Distribution of interfacial As atoms in the electron-beam exposure and epitaxy (EBE-epitaxy) technique for growing GaAs films on CaF2/Si(111) structures

✍ Scribed by H.C. Lee; H. Ishiwara; S. Furukawa; K. Saiki; A. Koma


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
542 KB
Volume
41-42
Category
Article
ISSN
0169-4332

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