Distribution of exit silicon ions over excited states after penetrating through carbon foils at 2.65, 4.3 and 6.0 MeV/u

✍ Scribed by T. Miyoshi; K. Noda; H. Tawara; I.Yu. Tolstikhina; V.P. Shevelko

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 601 KB
• Volume: 258
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2007.01.284