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Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS

✍ Scribed by Wojciech F. Lisowski; Albert H. J. van den Berg; Lambertus J. Hanekamp; Arend van Silfhout

Publisher: Springer
Year: 1992
Tongue: English
Weight: 502 KB
Volume: 107
Category: Article
ISSN: 0026-3672
DOI: 10.1007/bf01244472

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