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Distorted surface topography observed by atomic force microscopy

✍ Scribed by L.X. Li; R.P. Liu; Z. Xu; Y. Xu; W.K. Wang; C.Z. Fan

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 269 KB
Volume: 39
Category: Article
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2005.10.005

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