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Dissociation, transformation, and recombination of Si‐H bonds in hydrogenated crystalline silicon determined by in situ micro-Raman spectroscopy

✍ Scribed by Ma, Y.; Huang, Y.; Job, R.; Fahrner, W.


Book ID
115449343
Publisher
The American Physical Society
Year
2005
Tongue
English
Weight
90 KB
Volume
71
Category
Article
ISSN
1098-0121

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## Abstract Low temperature Plasma Enhanced Chemical Vapour Deposition (PECVD) grown amorphous hydrogenated Si (a‐Si:H) thin films form the basis of many photovoltaic and microelectronic devices such as solar cells and TFTs. Amorphous hydrogenated silicon in the form of nanoparticles has been produ