Dislocation of high qualityP-doped ZnTe substrate examined by X-ray topography

✍ Scribed by K. Yoshino; T. Kakeno; M. Yoneta; I. Yonenaga

• Publisher: Springer US
• Year: 2005
• Tongue: English
• Weight: 834 KB
• Volume: 16
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-005-2312-6