Dislocation microstructure and internal-stress measurements by convergent-beam electron diffraction on creep-deformed Cu and Al

✍ Scribed by M. E. Kassner; M. T. Pérez-Prado; M. Long; K. S. Vecchio

• Book ID: 107439194
• Publisher: The Minerals, Metals & Materials Society
• Year: 2002
• Tongue: English
• Weight: 195 KB
• Volume: 33
• Category: Article
• ISSN: 1073-5623
• DOI: 10.1007/s11661-002-0092-7