Dislocation induced line-broadening in cold-worked Pb-Bi binary alloy system in the α-phase using X-ray powder profile analysis
✍ Scribed by S.N. Dey; P. Chatterjee; S.P. Sen Gupta
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 153 KB
- Volume
- 51
- Category
- Article
- ISSN
- 1359-6454
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✦ Synopsis
An X-ray diffraction line profile analysis on cold-worked Pb-Bi alloys in the aphase is presented. The anisotropic broadening of X-ray diffraction lines has been interpreted in terms of dislocation induced strain broadening only. Dislocations are found to be predominantly of screw type from a modified Williamson-Hall analysis. Due to the almost symmetric shape of the X-ray line profiles, a restrictedly random dislocation distribution was assumed in the modified Warren-Averbach analysis. The dislocation densities are of the order of 10 11 cm Ϫ2 and decrease for annealed specimen. The dislocation arrangement parameter (m) decreases from more than 1.0 for cold-worked samples to less than 1.0 for annealed samples. This indicates a rather short ranged strain fields in annealed samples compared to cold-worked samples. Relative change in the dislocation arrangement parameter increases with solute concentration.